Specifications
|
|
Wavelength Range
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190 - 1100 nm
|
Optical System
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Double Beam, Blazed Holographic Grating (1200 lines/mm)
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Spectral Bandwidth
|
1nm
|
Wavelength Accuracy
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±0.5 nm
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Wavelength Repeatability
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≤ 0.2 nm
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Wavelength Setting
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Auto, Resolution 0.1nm
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Photometric Range
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0~200% T; -4~4A; 0~9999C
|
Photometric Accuracy
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±0.002 A (0~0.5A); ±0.003 A (0.5~1A); ±0.3% T (0~100%T)
|
Photometric Repeatability
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≤ 0.001 A (0~0.5A); ≤ 0.002 A (0.5~1A); ≤ 0.2% T (0~100%T)
|
Stray Light
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< 0.05% T (220/360nm)
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Scan Speed
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High, Medium, Low. (Max. 2000nm/minute)
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Base-Line Flattness
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±0.001 A
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Stability
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±0.001A/h (500nm; 0A)
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Noise
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≤ 0.2%T/3min (250/500nm, 0%T); =0.3%T/3min (250/500nm, 100%T)
|
Light Source
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Tungsten & Deuterium Lamp (Pre-aligned)
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Detector
|
Silicon Photodiode
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Sample Compartment
|
10mm path length
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Output
|
USB Port (Data) & Parallel Port (Printer)
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Dimension (W x L x H)
|
545 x 468 x 245 mm
|
Weight
|
18 kg
|
Model No. | Product | Description | |
---|---|---|---|
SPM-UVD1 | UV-VIS Spectrophotometer (Double Beam) | 190 - 1100 nm; UV-VIS/Double Beam | |
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